Near field optical microscope

ABSTRACT

The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.

The invention relates to a device for conducting near-field opticalmeasurements of a specimen, a method for conducting near-field opticalmeasurements and the use of the device.

Optical near-field microscopy is based upon the measurement of scatteredlight at a near-field probe which is generated by optical near-fieldinteraction between the near-field probe and a specimen. To achieve highlocal resolution known near-field probe tips are used, e.g. such tips asused in atomic force microscopy. The near-field probe is illuminated byfocused light to generate scattered light. Focusing should be as freefrom chromatic errors as possible in order to avoid errors inmeasurement when different wavelengths of the illuminated light areused, e.g. in the visible or mid-infrared spectrum. Hitherto,transmitting optical components have been used for focusing innear-field microscopy, e.g. optical lenses, by means of which therequisite suppression of chromatic errors due to material dispersion inthe components cannot be achieved, or can only be achieved to aninsufficient extent.

To avoid chromatic errors caused by material dispersion, T. Nakano etal. proposed focusing the illuminating radiation with reflective opticalcomponents, e.g. rotation-symmetrical concave mirrors (“Optik”, Vol. 94,1993, pp. 159-162). A reflector in the shape of a paraboloid, forexample, was used as a concave mirror, where the paraboloid axis wasperpendicular to the surface of the specimen under examination. Thisgeometry produces irradiation of the near-field probe more or lessperpendicular to the specimen's surface, as is usual with glass lensesin light-optical microscopy. A disadvantage of conventional reflectorsis that the direction of polarization of the illuminating radiation ismore or less transverse, whereas a light field oriented perpendicularlyto the specimen is preferred for the effect of optical near-fieldinteraction with the specimen. When the conventional concave mirror isinclined, i.e. its axis is not perpendicular to the specimen's surface,further disadvantages arise from the space required by the near-fieldprobe and the effort necessary to achieve a coma-free adjustment.

DE 10 2006 002 461 A1 and US 20070183060, which are incorporated byreference herein, disclose a mirror optic with a reflector in the shapeof a paraboloid, the edge of which is shaped so that at least twoillumination beam paths can be directed onto the near-field probe. The(reflecting) surface of the reflector is partly cut-out so that at leasttwo unobstructed light paths may be formed. By provision of at least oneedge cut-out of the reflector the location of a near-field probe at thefocal point of the reflector is facilitated such that, firstly, theillumination beam paths are not obstructed by the mounting of thenear-field probe, and secondly, operation of the near-field sensor isnot restricted by the operation (movement and oscillation) of thenear-field probe. However, these documents only describe one opticalpathway, which passes the parabolic reflector to focus on the probe. Inparticular the reflector 11 is cut so that a first illumination beampath I and a second illumination beam path II can be directed on to thefocal point 13, whereby only the first illumination beam path I (cfFIG. 1) strikes the reflector 11 in parallel to the paraboloid axis 12(x direction) and therefore focuses on the focal point 13 in accordancewith the parabolic reflector shape. The scattered light radiated to allsides by the near-field probe at the focal point 13 is partly collectedby the reflector 11 and sent as a collimated light beam I in the xdirection. The second illumination beam path II extends perpendicularlyto the paraboloid axis 12 and to the plane 18. The second illuminationbeam path II may only be directed on to the focal point 13 from above asshown in FIG. 1, from below the specimen (not shown) or from both sides.The second illumination beam path II creates an optical path along whichthe specimen and/or the near-field probe can be observed.

To fully use the capabilities of scanning near field optical microscopesit has recently become desirable to be able to use light of severalwavelengths simultaneously or sequentially, for illuminating the probeand taking the near-field measurement, which provides more data of thesample. To be able to apply light of several different wavelengths ithas been suggested in prior art to first combine the beams of thedifferent light sources, which combined beams are then focused on theprobe using the same optical path. For example, DE 10 2006 002 461 A1and US 20070183060 disclose that a light source device which can produceilluminating beams of several different wavelengths for measurementswith spectral resolution can be used. For this purpose, several lasersources with different emission wavelengths may be provided in the lightsource device. The illuminating beams on the different wavelengths arefocused on the near-field probe at the focal point of the near-fieldprobe in parallel to each other, i.e. overlapping beams, on the firstillumination beam path I.

Means are known in prior art to combine two laser beams onto one opticalpath, e.g., by applying coupling mirrors. These mirrors, however, haveseveral drawbacks, e.g., that only light of particular wavelengths canbe combined as these mirrors are only available for few wavelengths, andthey are expensive.

Another issue when one tries to focus light onto the probe is that theangular space around the probe accessible for the light path is limitedby the holder of the probe and by the holder for optical elements neededfor illuminating the probe and for detection of the probes deflection,for the case that cantilevered tips are used. Additionally it isdesirable to have a rather high numerical aperture for the opticaldevice which focuses the light used for near-field interaction onto theprobe in order to obtain both a good focusing and high intensities andtherefore an acceptable signal to noise ratio. Thus the optical devicesused for focusing and collecting also cover a significant part of thespace around the probe.

The objective of the invention is therefore to provide an improveddevice for the near-field optical measurement of a specimen which doesnot show the above mentioned problems of the prior art, in particular,to provide a device which allows a near-field optical measurement of aspecimen at several different wavelength of illumination light withoutbeing limited to particular wavelengths while providing high numericalapertures of the focusing in respect to the probe and while being ableto collect as much of the light emitted by the probe as possible.

The present invention relates to a device for the near-field opticalmeasurement of a specimen comprising

-   -   a probe,    -   a primary mirror, which is a concave mirror,    -   and one or more secondary mirror(s),    -   wherein each one of the secondary mirrors is located in an        independent optical pathway, whereby each one independent        optical pathway starts at the probe and passes the primary        mirror and the secondary mirror,    -   each one of the secondary mirrors is the first mirror located in        the respective independent optical pathway downwards the primary        mirror, whereby the optical pathways start at the probe and pass        the primary mirror,    -   and at least one of the secondary mirrors is arranged such that        the distance of the edge of the secondary mirror to the probe is        less or equal to about half the focal distance of the primary        mirror.

In this embodiment of the device of the present invention at least oneof the secondary mirrors, preferably two or more, more preferably all,is (are) arranged in close distance from the probe, more precisely, itsedge is not farther away from the probe than about half the focaldistance of the primary mirror, preferably one quarter of the focaldistance of the primary mirror, most preferably less. This ensures thatlight scattered from the tip even at small angles in respect to theparaboloid axis of the primary mirror is intercepted and reflected bythe secondary mirror(s). Preferably the probe is in the focus of theprimary mirror, therefore preferably the edge of at least one secondarymirror is not farther away from the point of focus of the primary mirrorthan about half the focal distance of the primary mirror, morepreferably one quarter of the focal distance or the primary mirror, mostpreferably less. Preferably the edge of the secondary mirror is the edgeof the reflective area of the secondary mirror. The distance of theprobe to the edge of the secondary mirror is the shortest distance ofthe edge of the secondary mirror to the probe, in particular to the tipof the probe.

In a preferred embodiment this device comprises at least two secondarymirrors, and the secondary mirrors are arranged such that the parts ofdifferent independent optical pathways which are located downwards thesecondary mirrors are not parallel to each other, whereby theindependent optical pathways start at the probe and pass the primarymirror and the respective secondary mirror.

The present invention further relates to a device for the near-fieldoptical measurement of a specimen comprising

-   -   a probe,    -   a primary mirror, which is a concave mirror,    -   and at least two secondary mirror(s),    -   wherein each one of the secondary mirrors is located in an        independent optical pathway, whereby each one independent        optical pathway starts at the probe and passes the primary        mirror and the secondary mirror,    -   each one of the secondary mirrors is the first mirror located in        the respective independent optical pathway downwards the primary        mirror, whereby the optical pathways start at the probe and pass        the primary mirror,    -   and the secondary mirrors are arranged such that the parts of        different independent optical pathways which are located        downwards the secondary mirrors are not parallel to each other,        whereby the independent optical pathways start at the probe and        pass the primary mirror and the respective secondary mirror.

Thus in this embodiment each of the independent optical pathways due toeach secondary mirror results in an outgoing beam with differentdirection.

Probes to be used in the devices according to the present invention areknown in the art. Suitable probes are known tips for SNOM, which can bemetallized, in particular, cantilevered tips are preferred, such as usedin atomic force microscopy. However also sharpened glass fibers orsimilar sharpened tips may be applied. SNOM tips are commerciallyavailable.

The primary mirror to be used in the device according to the presentinvention is a concave mirror. The shape of the concave, reflective areaof the mirror is such that the light of independent optical pathways canbe focused on the probe, in particular the tip of the probe. Thereforethe primary mirror is preferably arranged such that the concave side ofthe mirror faces the probe and the light of at least two opticalpathways can be focused on the probe, in particular the tip of theprobe. Thus the probe, in particular the tip of the probe, is preferablypositioned in the point of focus of the concave primary mirror.

In a preferred embodiment the primary mirror of the device of thepresent invention is a parabolic mirror, in particular a parabolicmirror as disclosed in DE 10 2006 002 461 A1 as also described in detailbelow. By using a parabolic mirror as primary mirror both thedisadvantages of conventional concave mirrors, such as those discussedin DE 10 2006 002 461 A1, are overcome, and the location of thenear-field probe in the focal point of the mirror and illuminationthereof is possible. Further several independent optical pathways whichfocus on the probe can be easily obtained.

Preferably a parabolic mirror, i.e. a reflector in the shape of aparaboloid, is used as primary mirror, more preferably the edge of whichis shaped so that several optical pathways are present which can bedirected onto one focal point of the primary mirror. The (reflecting)surface of the primary mirror is preferably partially cut out so that atleast two unobstructed optical pathways may be formed which extendthrough the focal point of the primary mirror. The provision of at leastone edge cut-out of the reflector advantageously facilitates thelocation of a near-field probe at the focal point of the primary mirror,so that, firstly, the optical pathways are not obstructed by themounting of the near-field probe and secondly operation of thenear-field sensor is not restricted by the operation (movement andoscillation) of the near-field probe. A mirror in the form of aparaboloid, the edge of which forms a circular arc in a planeperpendicular to the paraboloid axis, is not absolutely necessary forfault-free focusing along a optical pathway for excitation andobservation of scattered light at the near-field detector. In accordancewith the invention, even a paraboloid with at least one cut-out, whichalso provides optical access along an optical pathway for observing thespecimen and/or the near-field probe, facilitates effective lightcollection at the near-field probe. The cut reflector surfacefacilitates both the focusing of collimated first illuminating radiationon the near-field probe to generate scattered light and the focusing ofsecond illuminating radiation for observation of the specimen and/or thenear-field probe.

The shape of the preferred primary mirror used represents part of aparaboloid. The term “paraboloid” is used here to define any geometricalarea with an axis (paraboloid axis) of which a section parallel to theparaboloid axis produces a parabola. A section perpendicular to theparaboloid axis produces a circle. The paraboloid is a paraboloid ofrevolution. The intersection between the paraboloid axis and theparaboloid is called as the origin of the paraboloid. The preferredprimary mirror in the form of a paraboloid has a first edge whichrestricts the paraboloid surface in one direction parallel to theparaboloid axis. The first edge is also defined herein as the principalaperture of the paraboloid. The principal aperture typically extends ina plane perpendicular to the paraboloid axis.

If, in accordance with a modified embodiment of the invention, theprimary mirror in the form of a paraboloid is provided for an obliquealignment relative to the surface of the specimen, the principalaperture can also extend in a plane which forms an angle with theparaboloid axis which is not equal to 90°.

The primary mirror more preferably has a second edge which is formed bythe provision of a cut-out for the optical path used for detection ofthe probes deflection, for the case a cantilevered probe is used. Thesecond edge is also called herein the side aperture of the paraboloid.In general, the side aperture is formed by a section of the paraboloid,the plane of which section does not extend through the apex of theparaboloid and which is not perpendicular to the paraboloid axis. Thecut-out is typically formed by a section plane of the paraboloid whichextends in parallel to the paraboloid axis at a distance from it. Thepreferable distance is 1/10th to 2 times the focal length of the primarymirror, more preferable 1/10^(th) to one time the focal length of theprimary mirror. The section plane may be inclined in relation to theparaboloid axis, particularly when used with a reflector in an obliqueposition.

In accordance with a more preferred embodiment of the invention, theprimary mirror used in the device according to the present inventionforms a semi-paraboloid. In this case, the primary mirror has anadditional third edge which restricts the paraboloid form in or in thevicinity of a mid-plane of the paraboloid. The third edge is also called“the base aperture” of the paraboloid. In this case, the term“semi-paraboloid” means both precise halving and also the case of aparaboloid additionally cut out at the base aperture. The primary mirrorcan thus advantageously be located relative to a plane surface of aspecimen to be examined so that the paraboloid axis extends in parallelto or into the surface of the specimen. In this embodiment of theinvention the independent optical pathways are advantageously aligned inparallel to the surface of the specimen. Polarization of the independentoptical pathways can be aligned so that light with polarization more orless perpendicular to the surface of the specimen is provided at thenear-field probe, which alignment is advantageous due to an increasedantenna function of the probe.

Preferably cone angles in relation to the focal point of the primarymirror in the form of a paraboloid are spanned by the edges of theparabolic primary mirror, leaving angular space for the near-field probeand the independent optical pathways, and optionally the opticalpathways for measuring the deflection of the probe, for the case thatcantilevered probes are used. In accordance with a preferred embodimentof the device according to the invention, the cone angle α (illustratedin FIG. 2) of the reflector formed in a mid-plane between the second andthe third edge is set in a range of about 20° to about 70°, preferablyabout 50° to about 70°. The inventors have found that thereby ahighly-effective illumination of the focal point by the independentoptical pathways is possible for angles in this range without cuttingthe optical pathway too strongly for determination of the deflection ofthe probe, for the case a cantilevered probe is used.

The first edge of the paraboloid forms the principal aperture with apredetermined cone angle β (illustrated in FIG. 3). The cone angle βrepresents the angle in which the light reaches the focal point on theindependent optical pathways. If the cone angle β is in the preferredrange between about 30° to about 240°, more preferable in the range ofabout 60° to about 240°, the collection of light at the focal point ofthe primary mirror can be improved advantageously.

A major advantage of the primary mirror as preferably used as describedabove is that several operating conditions of near-field microscopy canbe fulfilled simultaneously, comprising the movement of the specimen inrelation to the near-field probe and primary mirror, the near-fieldprobe mounting, the reversibility of the independent optical pathwaysfor reading the scattered light and optical access to the microscopicobservation of the near-field probe and/or reading deflection of thenear-field probe, for the case a cantilevered tip is used. Moreover, thelight can be polarized so that the field strength contains a strongcomponent along the near-field probe perpendicular to the surface of thespecimen, which is a particular advantage due to the antenna function ofmetallic probe tips in scattering-type scanning near-field microscopy(s-SNOM).

If the primary mirror is provided with an adjustment element, inaccordance with a further preferred embodiment of the invention,advantages may emerge for an adjustment of the independent opticalpathways, in particular in relation to the paraboloid axis of theprimary mirror, if the preferred parabolic primary mirror is used. Theadjustment element is an optical component with a substantially planereflector, the surface of which is located perpendicularly to theoptical axis of the primary mirror, e.g. the parabolic axis for the casethe preferred parabolic mirror is used as primary mirror. A plane mirroror another reflective component with a flat surface may, for example, beused as the adjustment element.

The adjustment element is preferably located at one edge of the primarymirror, to preclude interference with the independent optical pathwaysor the optical pathway for determination of the deflection of the tip,for the case a cantilevered tip is used. Location on the second edge,i.e. on the periphery of the reflector cut-out, is particularlypreferable.

If the illumination intensity at the position of the adjustment elementis insufficient for reliable adjustment, the primary mirror of thedevice according to the present invention can be provided with adeflector element. The deflector element is typically located in theopening paraboloid in the independent optical pathways and diverts partof the illuminating radiation from one or more of the independentoptical pathways to the adjustment element. The deflector element ispreferably a plane, parallel, transparent plate, e.g. glass. The edge ofthe primary mirror is advantageously illuminated with the aid of thedeflector element.

The primary mirror in the device according to the present invention ispreferably arranged in relation to a specimen so that the paraboloidaxis of the primary mirror extends parallel to the surface of thespecimen. Alternatively, the paraboloid axis may be inclined in relationto the surface of the specimen at a reflector angle which is, forexample, set in the range above about 0° to about 60°, preferably about10° to about 45°, whereby in this case advantages may emerge for theadjustment or setting of a certain polarization of the firstillumination beam path in relation to the alignment of the surface ofthe specimen. In particular, the independent optical pathways can thusbe directed across the probe tip and its mounting, facilitating an evenmore compact structure. In order to obtain an optimal (high) collectionof light by the primary mirror according to this embodiment, the firstedge preferably does not extend through a plane perpendicular to theparaboloid axis, but through a plane perpendicular to the surface of thespecimen. The angle between the plane spanned by the first edge and anormal on the paraboloid axis corresponds to the reflector angle. Inaddition, the second edge preferably does not extend through a planeparallel to the paraboloid axis, but parallel to the surface of thespecimen. The angle between the plane spanned by the second edge and theparaboloid axis then also corresponds to the reflector angle.

The primary mirror in the device of the present invention may beconstructed by several parts, which together form the primary mirror. Inthis embodiment manufacture of the parts may be simplified, especiallyfor very high cone angles. Preferably the primary mirror is build fromone piece in order to avoid disadvantages which may arise due to thejunction lines between different parts.

The device according to the present invention further comprises one ormore secondary mirrors, preferably two or more, most preferable two.Each one of the secondary mirrors is located, i.e. mounted, in anindependent optical pathway. The term ‘optical pathway’, or ‘optical(beam) path’, as used herein is the path that light takes in traversingthe optical system. An ‘independent optical pathway’ as used herein isthe optical path which starts at the probe and passes the primary mirrorand the secondary mirror, in this order. For the case of illumination ofthe probe the light follows these independent optical pathways, andpasses the mirrors, in reversed order as defined above. The light whichis emitted by the probe follows the independent optical pathway andpasses the mirrors, i.e. is reflected at the mirrors, in the order asdefined above.

Thus the term ‘independent optical pathway which starts at the probe andpasses’ one or more mirrors as used herein means the path that light,emitted from the probe, takes, the direction of the path being definedby the direction of the light emitted by the probe. Thus a position‘downwards’ on this path means that the light emitted by the probepasses this position later, and a position ‘upwards’ on this path meansthat the light emitted by the probe passes this position earlier.

Each one of the secondary mirrors is located in an independent opticalpathway in the device according to the present invention. Twoindependent optical pathways are herein termed as ‘independent’ if theseoptical paths are not superimposed, preferably the independent opticalpathways are not parallel and do not overlap, except at the probe. Thustwo independent optical pathways are e.g. two different optical pathsfor the light to take to the probe, or from the probe, respectively.

In one embodiment of the device of the present invention at least one ofthe secondary mirrors is arranged such that the distance of the edge ofthe secondary mirror to the probe is less or equal to about half thefocal distance of the primary mirror, preferably equal or less than 1/10of the focal distance of the primary mirror.

The secondary mirror in the device according to the present invention isthe first mirror on each independent optical pathway the light isreflected at after being emitted from the probe and after beingreflected at the primary mirror. For the case two or more secondarymirrors are present, these secondary mirrors are preferably arrangedsuch that the parts of different independent optical pathways which arelocated downwards the secondary mirrors are not parallel to each other.Thus e.g. two optical pathways start at the probe in differentorientations, are then reflected at the primary mirror and are, e.g. inthe case of a parabolic mirror, then parallel to each other, but notoverlapping, and are finally reflected at two different secondarymirrors into two different orientations, thus they are not parallel anymore. The term parallel as used herein means “parallel and the samedirection”, which correspond to an angle of 0°. Parallel pathways withopposing direction are antiparallel, what means angle of 180°. Morepreferably the parts of different independent optical pathways which arelocated downwards the secondary mirrors, form an angle of about 20° toabout 180°, preferably about 90° to about 180°, in particular about 100°to about 160°, such as about 120°. This angle in defined as the anglebetween the two corresponding straight lines which run in the center oftwo parts of different independent optical pathways which are locateddownwards the secondary mirrors. The straight lines have the directiondownwards the optical pathway. For the case that these straight linesintersect, the angle is the angle between the two straight lines indownward direction of the pathways; for the case that these straightlines are skew, the angle is the corresponding angle between twointersecting auxiliary straight lines which are parallel to the straightlines running in the center of the parts of different independentoptical pathways which are located downwards the secondary mirrors. Theoptical (beam) pathway is preferably defined as the collection of (all)rays that are scattered starting from the probe and reflected first bythe primary and then by the same secondary mirror, respectively, thusmost preferably by each secondary mirror present in the device anindependent optical pathway is formed. The outgoing beams do generallynot have to have a circular or highly symmetric cross sections.

In one preferred embodiment two independent optical pathways arereflected on the primary mirror at different areas of the primarymirror, i.e. the reflective area on the primary mirror used to reflectone independent optical pathway is not used to reflect any otherindependent optical pathway. More preferably two independent opticalpathways do not overlap except at the probe, i.e. the independentoptical pathways do not intersect, except at the probe. Intersection ofthe independent optical pathways at the probe is necessary, as allindependent optical pathways are focused on the probe, in particular onthe tip of the probe, via the primary mirror.

In a preferred embodiment of the device according to the presentinvention at least one of the secondary mirrors is a substantiallyplanar mirror, more preferably all secondary mirrors are substantiallyplanar mirrors.

In a further preferred embodiment of the device according to the presentinvention the primary mirror is a parabolic mirror, e.g. the parabolicmirror as described above. More preferably the primary mirror is aparabolic mirror, e.g. the parabolic mirror as described above, and allsecondary mirrors are planar mirrors. A particularly preferred parabolicmirror to be used as primary mirror is the mirror as disclosed in DE 102006 002 461 A1.

By the combination in the device of the invention of one primary mirror,which is preferably parabolic, and at least two secondary mirrors, whichreflect the optical pathways into two different directions, at least twoindependent optical pathways are provided. These independent opticalpathways can advantageously be used to illuminate the probe with lightof at least two different wavelengths without being limited to anyspecific wavelength, as one separate optical pathway can be used foreach wavelength. These independent optical pathways can also be used tocollect the light emitted by the probe, in particular the tip of theprobe. Optionally a further independent optical pathway can be used tocollect the light emitted by the probe without being disturbed byilluminating light. Further this combination in the device of theinvention of one primary mirror, which is preferably parabolic, and atleast two secondary mirrors as described above thus enables the focusingof at least two independent optical pathways on the probe, while at thesame time it is still possible to detect the deflection of the probe,for the case a cantilevered probe is used, although the space around theprobe is rather crowded. If further at least one of the secondarymirrors is arranged such that the distance of the edge of the secondarymirror to the probe is less or equal to about half the focal distance ofthe primary mirror, an additionally advantageous collection of the lightemitted by the probe is achieved, as also the light reflected on theprimary mirror close to its apex can be reflected by the secondarymirror. Otherwise this light would hit the probe or the holder of theprobe and could not be used for detection.

Additionally the use of one single primary mirror ensures a largeangular space for focusing on the probe by filling nearly half the spacearound the probe is available. In optics, the numerical aperture (NA) ofan optical system is a dimensionless number that characterizes the rangeof angles over which the system can accept or emit light. NA is definedby n*sin(θ), wherein θ is the half-angle of the maximum cone of lightthat can enter or exit the lens. Thus a corresponding NA can bedetermined, wherein n=1 for air, which corresponds to the sin(θ),wherein θ is the half-angle of the maximum cone of light spanned by theprimary mirror. Preferably the primary mirror of the device of thepresent invention has a numerical aperture NA in the range of about 0.2to about 1, most preferably at least 0.5 up to about 1. These highnumerical apertures of the system can only be obtained due to the usageof one primary mirror, combined with the secondary mirror(s) to provideindependent optical pathway(s), whereby it is ensured that as much oflight emitted by the probe into the angular space spanned by the primarymirror is collected and detected, although there is limited space aroundthe probe.

The secondary mirrors are preferably rather close to the probe and tothe primary mirror. Preferable the distance of the centre of thereflective area of the secondary mirrors to the focal point of theprimary mirror is less than about four times the focal distance of theprimary mirror, more preferably less than about two time the focaldistance of the primary mirror. This is to ensure that at least twoindependent optical pathways are available for the illumination of theprobe and/or determination of the light emitted by the probe, which bothhave a high numerical aperture as defined above. Preferably in thisembodiment of the device according to the present invention at least oneof the secondary mirrors is arranged such that the distance of the edgeof the secondary mirror to the probe is less or equal to about half thefocal distance of the primary mirror, preferably equal or less than 1/10of the focal distance of the primary mirror.

In a preferred embodiment of the present invention the probe or theprobe holder is located, i.e. mounted, substantially between two of thesecondary mirrors in the device of the invention. More preferable thesecondary mirrors, most preferable, two of them, are arrangedsubstantially symmetrically around the probe, preferable in the planeparallel to the specimen, as indicated in FIG. 4. Preferably in thisembodiment of the device according to the present invention at least oneof the secondary mirrors, most preferably both secondary mirrors, is(are) arranged such that the distance of the edge of the secondarymirror(s) to the probe is less or equal to about half the focal distanceof the primary mirror, preferably equal or less than 1/10 of the focaldistance of the primary mirror. This arrangement ensures excellentstability of the optical pathways in respect to adjustability andvibrations, while keeping the optical pathways short and the numericalapertures as high as possible.

In a particularly preferred embodiment the device according to thepresent invention contains two secondary mirrors, and therefore also twoindependent optical pathways as defined above.

The invention relates also to a method for scanning the opticalnear-field of a specimen, wherein a device as described above isapplied.

The invention relates further to the use of a device a described abovefor scanning the optical near-field of a specimen.

The device of the present invention is preferably provided with at leastone light source device by means of which the near-field probe can beilluminated at the focal point of the primary mirror optic via one ofthe independent optical pathways. The mirror optic, i.e. all the mirrorsused comprising the primary mirror and the secondary mirrors, and thelight source device are preferably fixed in relation to each other sothat adjustments during optical near-field measurement can be avoided.The light source device can advantageously produce illuminating beams ofseveral different wavelengths for measurements with spectral resolution.For this purpose, several laser sources with different emissionwavelengths may be provided in the light source device. This may becomenecessary if illumination is intended using light of more differentwavelengths that independent optical pathways are available. Theilluminating beams of the different wavelengths produced by one sourcedevice can then be focused on the near-field probe at the focal point ofthe primary mirror on one of the independent optical pathways.

The device according to the present invention is preferably alsoprovided with a detector by which the light scattered by the near-fieldprobe can be detected. The mirror optic used according to the inventionadvantageously detects a large spatial angle to collect the lightscattered at the near-field probe, so that the near-field microscope isdistinguished by high collection efficiency and an improvedsignal-to-noise ratio. The spatial angle covered by the primary mirrorcorresponds to a large cross-section of optionally parallel beams on theindependent optical pathways. As the parallel beams on each independentoptical pathway are typically not compact but deformed in the form of arectangle or elongated, a division of the parallel beam into two or morebeams on each independent optical pathway extending adjacently may beprovided. Several beams may thus be advantageously directed on to thenear-field probe in this way or the light scattered back may thus bedetected with spatial resolution.

The figures illustrate further details and advantages of the invention.

FIG. 1 is a diagrammatic representation of the paraboloid shape of theprimary mirror, i.e. a reflector of a mirror optic according to DE 102006 002 461 A1;

FIGS. 2 and 3 are diagrammatic illustrations (side and top view) ofpreferable embodiments of parts of the device according to the presentinvention.

FIG. 4 is a diagrammatic top view of a device of the present inventionshowing a preferred embodiment of the inventive arrangement of a primarymirror and two secondary mirrors.

The invention is further illustrated by the detailed description of thefigures:

FIG. 1 illustrates an embodiment of a primary mirror 10, formed by aconcave mirror. The reflector 11 is formed on the inner curve of theconcave mirror, wherein the surface of the reflector 11 forms a recessof a paraboloid with the focal point 13 on the paraboloid axis 12. Inthe example illustrated, the paraboloid axis 12 extends in direction x.The paraboloid surface opens in the direction x. The shape of thereflector 11 is determined by the following three sections of theparaboloid. The first section extends in parallel to the y-z plane toform the first (forward) edge 16.1, 16.2 of the reflector 11. Theprincipal aperture of the paraboloid is cut so that the focal point 13lies outside the space enclosed by the reflector 11. The second andthird sections extend in parallel to the x-y plane, forming the upper(second) edge 15 and the lower (third) edge 17. With upper edge 15 thecut-out 14 provided according to the invention takes the form of a sideaperture of the paraboloid. The lower edge 17 lies in a plane 18 whichis at a predetermined distance z₁ from the paraboloid axis 12 containingthe focal point 13. The distance z₁ is, for example, about 1 mm. Thethird edge restricts the shape of the semi-paraboloid in the vicinity ofthe middle plane of the paraboloid. Alternatively, a semi-paraboloid maybe created in which the plane 18 coincides with the central plane of theparaboloid. In relation to the focal point 13, the lower edge 17 and theupper edge 15 form the cone angle α and the root points of the forwardedges 16.1, 16.2 form the cone angle 13.

The reflector 11 is cut so that a the independent optical pathways (onlyone path I is indicated) and a optical pathway II for the detection ofthe deflection of the probe to be used, if cantilevered tips areapplied, can be directed on to the focal point 13. The path I asindicated (illustrated diagrammatically) displays the direction of allthe optical pathways striking the reflector 11 in parallel to theparaboloid axis 12 (x direction), which are focused on the focal point13 in accordance with the parabolic reflector shape. The scattered lightradiated to all sides by a near-field probe at the focal point 13 iscollected in the opposite direction by the reflector 11 and diverted inthe x direction.

The optical pathway II extends perpendicularly to the paraboloid axis 12and to the plane 18. This pathway II may be directed on to the focalpoint 13 from the reflector side (as shown), from the opposite side, orfrom both sides. This optical pathway II is typically used to detect thedeflection of the probe, for the case cantilever probes are used.

The independent optical pathways (indicated by path I) create severaloptical paths on which the specimen and/or the near-field probe can beobserved. In particular, the surface of the specimen can be detected bya microscope and/or the orientation of the near-field probe can bedetected by an optical deflection detector.

For use in near-field microscopy the reflector 11 may be formed by ametal foil, e.g. made of nickel, or by a coated concave surface of anoptical component, as illustrated in FIGS. 2 and 3.

FIGS. 2 and 3 illustrate an embodiment of an optical near-filedmicroscope 100 with the primary mirror 10, a near-field probe 20, alight source device 39, a detector device 40 and a camera device 50. Thediagrammatically illustrated components 20 to 50 (only partially shownin the figure) and a control and analysis device (not shown) of thenear-field microscope are constructed in the way known from conventionalnear-field microscopy.

The primary mirror 10 includes a mirror body with a concave surface,which forms the reflector 11. The surface of the reflector 11 representsa recess in a paraboloid as it has been described above. The mirror bodyconsists, for example, of aluminium.

The primary mirror 10 is e.g. located at distance z₁ above the surface 2of the specimen 1 to be examined. The cone angle α between the loweredge 17 and the upper edge 15 is e.g. 50°. Parallel to the surface 2 ofthe specimen 1, the cone angle β (see FIG. 3) is e.g. 150°. Theparaboloid axis 12 of the reflector 11 extends in parallel to surface 2.

In accordance with a modified embodiment of the invention, theparaboloid axis 12 may be inclined relative to the surface 2 at areflector angle of e.g. 20°. The first edge 16.1, 16.2 then extendsperpendicularly to the surface of the specimen in a plane whichcorrespondingly spans an angle of e.g. 70° with the paraboloid axis. Inaddition, the second edge 15 also spans e.g. 20° with the paraboloidaxis, corresponding to the reflector angle.

The adjustment element 19 is located on the upper (second) edge 15 ofthe edge recess 14. The adjustment element 19 includes a plane mirror,the surface of which is aligned perpendicularly to the paraboloid axis12. The radiation directed e.g. along one of the independent opticalpathways indicated as the beam path I can be adjusted precisely inparallel to the paraboloid axis 12 with the adjustment element 19. Forthis purpose it is sufficient for the mirror surface of the adjustmentelement 19 to have small dimensions of e.g. 1 mm². Should the intensityof radiation on edge 15 be insufficient for the purposes of adjustment,a coplanar transparent plate 19.1 (shown as a dotted line) can be usedin one of the independent optical pathways as indicated as beam path I,by which part of the light is diverted on to the adjustment element 19,without having any major effect on irradiation of the probe tip 21.

The light radiated in parallel to paraboloid axis 12 is focused on theprobe tip 21 by the reflector 11. Focusing a strong component of theelectrical field standing perpendicularly to the surface 2 of thespecimen 1 on to the probe tip 21 is advantageously facilitated.

As illustrated in FIG. 4, which is a top view, the holder of the probe(31) (probe not shown) is flanked by two secondary mirrors (30) whichthereby provide two independent optical pathways III and IV. The partsof the independent optical pathways which are located downwards thesecondary mirrors (where the symbols “III” and “IV” are indicated) forman angle of roughly 120°. The edge of the secondary mirror (32) is closeto the probe to ensure reflection of the light which is reflected by theprimary mirror close to its apex.

1. A device for the near-field optical measurement of a specimencomprising a probe, a primary mirror (10), which is a concave mirror,and at least two secondary mirror(s) (30), wherein each one of thesecondary mirrors (30) is located in an independent optical pathway,whereby each one independent optical pathway starts at the probe andpasses the primary mirror (10) and the secondary mirror (30), each oneof the secondary mirrors (30) is the first mirror located in therespective independent optical pathway downwards the primary mirror(10), whereby the optical pathways start at the probe and pass theprimary mirror (10), and the secondary mirrors (30) are arranged suchthat the parts of different independent optical pathways that arelocated downwards the secondary mirrors (30) are not parallel to eachother, whereby the independent optical pathways start at the probe andpass the primary mirror (10) and the respective secondary mirror (30).2. A device for the near-field optical measurement of a specimencomprising a probe, a primary mirror (10), which is a concave mirror,and one or more secondary mirror(s) (30), wherein each one of thesecondary mirrors (30) is located in an independent optical pathway,whereby each one independent optical pathway starts at the probe andpasses the primary mirror (10) and the secondary mirror (30), each oneof the secondary mirrors (30) is the first mirror located in therespective independent optical pathway downwards the primary mirror(10), whereby the optical pathways start at the probe and pass theprimary mirror (10), and at least one of the secondary mirrors (30) isarranged such that the distance of the edge of the secondary mirror (32)to the probe is less or equal to about half the focal distance of theprimary mirror (10).
 3. The device according to claim 2, wherein thesecondary mirrors (30) are arranged such that the parts of differentindependent optical pathways that are located downwards of the secondarymirrors (30) are not parallel to each other, whereby the independentoptical pathways start at the probe and pass the primary mirror (10) andthe respective secondary mirror (30).
 4. The device according to claim1, wherein the at least two independent optical pathways are reflectedon the primary mirror (10) at different areas of the primary mirror. 5.The device according to claim 1, wherein the at least two independentoptical pathways do not overlap except at the probe.
 6. The deviceaccording to claim 1, wherein the secondary mirrors (30) are planarmirrors.
 7. The device according to claim 1, wherein the primary mirror(10) is a parabolic mirror.
 8. The device according to claim 1, whereinthe secondary minors (30) are arranged such that the parts of theindependent optical pathways that are located downwards the secondarymirrors, form an angle of about 20° to about 180°.
 9. The deviceaccording to claim 1, wherein the probe or a holder of the probe islocated substantially between two of the secondary mirrors (30).
 10. Thedevice according to claim 1, wherein said device has two secondarymirrors (30).
 11. The device according to claim 1, wherein the distancefrom the centre of the reflective area of the secondary mirror(s) (30)to the focal point of the primary minor (10) is less than about fourtimes the focal distance of the primary mirror (10).
 12. A method forscanning the optical near-field of a specimen, comprising the step ofanalyzing the specimen using the device according to claim
 1. 13.(canceled)
 14. The device according to claim 1, wherein the distancefrom the centre of the reflective area of the secondary mirror(s) (30)to the focal point of the primary mirror (10) is less than about twotimes the focal distance of the primary mirror (10).